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用大电流驱动采用SELAX技术的高分辨率显示系统的整体可靠性

Integration of Reliability with High Current Drivability by Using SELAX Technology for High-Resolution (>300ppi) System-in-Displays
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摘要 应用低压多晶硅TFT和高压多晶硅TFT组合开发成功高分辨率(>300ppi)LCD/OEL显示系统,也就是说,将受激准分子激光结晶化(ELC)TFT用于耐高压显示电路,而将选择扩大激光结晶化(SELAX)TFT用于低功耗高性能显示电路。在这两种混合型的TFT中,扩大激光结晶化(SELAX)TFT成功地整合了显示系统大电流驱动的可靠性。 High-resolution (〉300ppi) system-in-display have been developed by using mixed low-voltage/high-voltage poly-silicon TFTs. That is, ELC TFTs are used for the display circuits with high-voltage endurance, and SELAX TFTs are used for the low-power, high-performance display Circuits. In this hybrid TFT, the SELAX TFTs successfully integrate reliability with high current drivability.
出处 《现代显示》 2006年第8期20-23,共4页 Advanced Display
关键词 低温多晶硅 激光结晶化 扩大激光结晶化 耗尽雪崩热载流子 low-temperature polycrystalline-silicon (LTPS) excimer-laser-crystallization (ELC) selectively enlarging laser crystallization (SELAX) drain-avalanche hot-carrier (DAHC)
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参考文献6

  • 1M. Tai, M. Hatano, S. Yamaguchi, T. Noda, S. K.Park, T. Shiba, and M. Ohkura. Performance of Poly-Si TFTs Fabricated by SELAX [C] .IEEE Trans. Electron Devices, vol. 51, 2004. 934-939.
  • 2Y. Toyota, T. Shiba, and M. Ohkura. A New Model for Device Degradation in Low-Temperature N-Channel Polycrystalline Silicon TFTs under AC Stress [C]. IEEE Trans. Electron Devices, vol. 51,2004. 927-933.
  • 3M. Kimura, R. Nozawa, S. Inoue, T. Shimoda, B.O.-K. Lui, S W.-B. Tam, and P. Migliorato. Jpn:Appl. Phys. 40, 2001. 5227-5233.
  • 4P. Migliorato, S. W.-B. Tam, B. O.-K. Lui, and T.Shimoda. Jpn: Appl. Phys. 89,2001. 6449-6456.
  • 5E. Takeda and N. Suzuki. An Empirical Model for Device Degradation Due to Hot-Carrier Injection[C]. IEEE Electron Device letters, vol. EDL-4,1983.111-113.
  • 6R. S. Muller and T. I. Kamins. Device Electronics for Integrated Circuits [C]. Wiley,1995.194-198.

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