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生长温度对ZnO薄膜性能的影响 被引量:11

Effect of Growth Temperature on Properties of ZnO Thin Films
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摘要 采用常压金属有机化学气相沉积技术在Al2O3(0001)衬底上生长出高质量的ZnO薄膜.用X射线双晶衍射ω和θ-2θ扫描、室温光致发光研究了不同生长温度对ZnO薄膜的结构、发光性能的影响.结果表明,随着生长温度的升高,ZnO薄膜的c轴晶格常数逐渐增大,a轴晶格常数逐渐变小,同时带隙相应逐渐增大. High quality ZnO thin films are grown on A12 03 (0001)substrates by atmospheric-pressure metal organic chemical vapor deposition (AP-MOCVD). Effects of growth temperature on the structure, optical characteristics of ZnO thin films are investigated by double crystal X-ray diffraction (ω and θ-2θ scans) and room temperature photoluminescence(PL) spectra. With the rise of the growth temperature,the c-axis lattice constant of the ZnO films increases while the bandgap becomes wider.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2006年第7期1221-1224,共4页 半导体学报(英文版)
基金 国家高技术研究发展计划(批准号:2003AA302160) 电子信息产业发展基金资助项目~~
关键词 ZNO MOCVD X射线双晶衍射 光致发光 应变 ZnO MOCVD DCXRD PL strain
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参考文献12

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