半导体材料禁带宽度测试装置的研制

Development of Energy Gap Measuring Device for Semiconductor Materials

根据光电导方法，研制了 ＤＢ－１型半导体材料禁带宽度测试装置。该装置经测 试验证及用户使用表明：整个测试系统具有测量数值精确、测试速度快、样品安装方 便、装置的稳定性和重复性好等优点，实现了对半导体材料禁带宽度的测定，可为进 一步研究半导体材料的能带模型提供实验数据。

Based on the photoconductive method the Energy Gap Measuring Device for Semiconductor Material-Type DB-1 has been developed.The character of device has been verified by testing and using, It is an easily installing sample, and has fast measurement velocity, precise measurement value as well as good stability and repeatability, It can afford the experimental data for further study of the energy model of semiconductor materials.