JTAG软核设计与仿真

JTAG Soft Core Define and Emulation

JTAG边界扫描测试是一种新型的VLSI电路测试及可测试性设计方法。本文论述了边界扫描技术的结构特征及软核设计方法,并分析了JTAG电路中数据传输的路径及电路对速度的影响,以采样指令为例进行了功能仿真。

Boundary-scan technology is a new and effective way of test and design-for-testability for VLSI circuits. In the paper the boundary-scan the configuration character and soft core design methods are introduced. This paper also analyze the route of data transfers and effect on speed in JTAG circuit, taking sampling instruction for example, function of soft core is emulated.