Sm富勒烯的芯态光电子能谱

Core-level photoemission of Sm fullerides

用X射线光电子能谱研究了Sm掺杂的固态C60相衍变和芯电子态.在SmxC60中Sm的含量x小于0.5时,样品是固溶相;在x=0.5和x=2.75之间的掺杂阶段,样品是这两个相的混合.在x=2.75和x=6之间的高掺杂阶段未观察到相分离的X射线光电子能谱证据.Sm4f,4d的实验数据表明Sm的价态是+2.二价Sm3d52芯态谱线存在两个子峰.

Phases and core-levels of Sm-intercalated C60 thin films arc researched with X-ray photoemission spectroscopy. The solid solution phase dominates until the stoichiometry of Sm0.5 C60 Below the intercalation level of Sm2.75 C60, the sample is phaseseparated into the solid solution phase and Sm2.75 C60, while the sample is not the mixture of Sm2.75 C60 and Sm6 C60 with the Sm concentration higher than Srn2.75 C60. Experimental data of Sm 4f and 4d clearly reveal the valence state of Sm is divalent for Sm fullerides. Two subpeaks of divalent Sm 3d5/2 level arc found.