摘要
本文分析了ASD板在ATLAS探测器最外层的μ子探测器中的工作环境以及作用,并按照其对ASD板质量的要求设计了一套对ASD板质量的专用批量测试系统。本文详细叙述了测试系统的构成、测试原理以及对ASD板的测试结果。
In this paper, the working environment and the functions of Amplifier-Shaper-Discriminator （ASD） boards for TGC in ATLAS Muon Spectrometer is introduced and a special inspection system for ASD boards is described based on the requirement in the ATLAS experiment. The testing principle and inspection results of a large quantity of ASD boards inspected by the system are also described in detail.
出处
《核技术》
EI
CAS
CSCD
北大核心
2006年第8期614-618,共5页
Nuclear Techniques
基金
国家自然科学基金国际合作重大项目(0051140291)资助
