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用电子束曝光方法在优化设计的绝缘体上硅脊状波导上实现布拉格光栅的制作和评价(英文)

Fabrication and Evaluation of Bragg Gratings on Optimally Designed Silicon-on-Insulator Rib Waveguides Using Electron-Beam Lithography
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摘要 报道了一种用电子束曝光的方法在绝缘体上硅的脊状光波导上制做布拉格光栅的技术.考虑到实际的光子学集成的应用,讨论了这个带有布拉格光栅的脊状光波导的优化设计,给出了该布拉格光栅的测试和理论模拟结果.通过薄化绝缘体上硅的波导层的厚度和光栅的深腐蚀加工,获得了高达30cm-1的光栅耦合系数. The fabrication of Bragg gratings on silicon-on-insulator (SOI) rib waveguides using electron-beam lithography is presented. The grating waveguide is optimally designed for actual photonic integration. Experimental and theoretical evaluations of the Bragg grating are demonstrated. By thinning the SOl device layer and deeply etching the Bragg grating, a large grating coupling coefficient of 30cm^-1 is obtained.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2006年第8期1347-1350,共4页 半导体学报(英文版)
基金 国家自然科学基金资助项目(批准号:60577018)~~
关键词 集成光学 布拉格光栅 绝缘体上硅 脊状光波导 integrated optics Bragg grating silicon-on-insulator rib waveguide
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参考文献10

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