核保障的微粒分析与二次离子质谱仪

Particle Analysis in Nuclear Safeguards and Secondary Ion Mass Spectrometer

环境监测是加强核保障体系的重要监测手段,微粒分析是环境监测中最重要的分析技术之一。与整体分析相比,微粒分析能获得更多信息,因而已发展成为核保障环境监测中的常规分析方法。动态型二次离子质谱仪(SIMS)是进行微粒同位素分析最适用的测量仪器之一。在用SIMS分析各种性质的环境样品和擦拭样品时,样品制备是关键性的技术。

Environmental monitoring is an essential monitoring method in the enhanced international safeguards. Particle analysis is a high sensitive analytical technology. The particle analysis can obtain more information than bulk analysis. It has been a conventional analytical method in the international safeguards system of International Atomic Energy Agency（IAEA）. The Secondary Ion Mass Spectrometer （SIMS）, especially dynamic SIMS, is the most suitable instrument for particle isotopic analysis. Sample preparation is a key technical issue for analyzing swipe samples and environmental samples with various characteristics by SIMS.