摘要
本文提出了一种结合修正空间三点相移和双频光栅投影技术来测量含复杂突变三维物体面形的方法。首先介绍了修正空间三点相移和双频光栅投影技术的基本原理,然后通过计算机模拟和实验,证明了该方法的有效性。
A novel technique including amendatory three-step spatial phase-shifting and dual-frequency grating for profilometry of object containing depth discontinuities is presented. First, the principle of amendatory three-step spatial phase-shifting and dual-frequency grating are clarified,and the validity and performance of this algorithm are verified by computer simulations and experimental results.
出处
《微计算机信息》
北大核心
2006年第09S期271-273,283,共4页
Control & Automation
基金
上海市自然科学基金(批准号04ZR140477)
上海市教育委员会发展基金(批准号:04Lb07)
关键词
空间三点相移
双频光栅投影
three-step,spatial,phase-shifting,dual-frequency grating
