摘要
通过对半导体中轻杂质及其周围原子的局域声子态密度求解，获得了轻杂质引起的局域模的局域性与质量亏损因子之间的关系，并证明，计人模式的局域度的质量亏损模型可以获得与实验结果吻合的局域模频率．
Abstract The relation between the localization of impurity local mode and the mass defect factor is obtained by calculating the local density of states (LDOS.)of the impurity and its surrounding atoms in semiconductor.Based on this results,the calculation of the frequency of local mode by a linear chain model including the localization shows a good agreement between the theoretical results and the experimental ones.
