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Crystal structural refinement for NdAlSi 被引量:1

Crystal structural refinement for NdAlSi
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摘要 The compound NdAlSi was studied using X-ray powder diffraction technique and refined by the Rietveld method. The compound NdAlSi has tetragonal α-ThSiE-type structure, space group I41/amd (No. 141), Z = 4, and the lattice parameters a = 0.41991(1) nm, c = 1.44916(3) nm. The Smith and Snyder figure of merit FN is F30= 103.1(36). The R-factors of Rietveld refinement are Rp= 0.113 and Rwp= 0.148, respectively. The X-ray powder diffraction data is presented in this article. The compound NdAlSi was studied using X-ray powder diffraction technique and refined by the Rietveld method. The compound NdAlSi has tetragonal α-ThSiE-type structure, space group I41/amd (No. 141), Z = 4, and the lattice parameters a = 0.41991(1) nm, c = 1.44916(3) nm. The Smith and Snyder figure of merit FN is F30= 103.1(36). The R-factors of Rietveld refinement are Rp= 0.113 and Rwp= 0.148, respectively. The X-ray powder diffraction data is presented in this article.
出处 《Rare Metals》 SCIE EI CAS CSCD 2006年第4期355-358,共4页 稀有金属(英文版)
基金 This project was financially supported by the Doctoral Start-up Foundation of Guangxi University.
关键词 NdAlSi crystal structure X-ray powder diffraction data Rietveld method NdAlSi crystal structure X-ray powder diffraction data Rietveld method
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  • 1Long Z.,Zhou Y.,Zhuang Y.,Chen R.,LiuJ.,and Wang X.,Phase relations in the Nd-Al-Si system at 500℃,J.AlloysCompd.,2001,325:190.
  • 2Villars P.,Pearson's Handbook,Crystallographic Data for Intermetallic Phases,Deskedition,ASM International,The Materials Information Society,Materials Park,OH,1997.
  • 3Pukas S.,Lutsyshyn Y.,Manyako M.,and Gladyshevskii E.,Crystal structures of the RAlSiand RAlGe compounds,J.Alloys Compd.,2004,367:162.
  • 4Jade5.0,XRD Pattern Processing Materials,Data Inc.,1999:444.
  • 5Smith G.S.and Snyder P.L.,FN:a criterion for rating powder diffraction patterns andevaluating the reliability of powder-pattern indexing.J.Appl.Cryst.,1979,12:60.
  • 6Rietveld H.M.,Line profiles of neutron powder-diffraction peaks for structurerefinement,Acta Crystallogr.,1967,22:151
  • 7Rietveld H.M.,Profile refinement method for nuclear and magneticstructures,J.Appl.Crystallogr.,1969,2:65
  • 8Flandorfer H.,Kaczorowski D.,Grobner J.,Rogl P.,and Wouters P.,The systemsCe-Al-(Si,Ge):phase equilibria and physical properties,J.Solid State Chem.,1998,137:191.
  • 9Norman F.M.Henry and Kathleen Lonsdale,International Tables for X-ray CrystallographyVol.Ⅳ,Kynoch Press,Birmingham,1974:245
  • 10Young A.R.,Larson A.C,and PaivaSantos C.O.,User's Guide to Program DBWS9807a forRietveld Analysis of X-ray and Neutron Powder Diffraction Patterns,School ofPhysics,Georgia Institute of Technology,Atlanta,1999

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