摘要
利用(FD)2TD方法对全镀金属膜四面锥尖端近场的光增强分布进行了数值模拟,结果表明在平行光束从全镀金属膜四面锥底面入射条件下,尖端近场可以获得纳米尺度的聚焦光斑,并且光场可以得到较大的增强。
The electric field distribution for pyramdial tip entirely coated with Ag film was simulated with (FD)^2 TD method . The results indicate that the tip of this geometry can not only produce focusing spot at nanometer scale but also engender enormous field enhancement under the excitation of plane wave from the base of pyramidal tip.
出处
《电子显微学报》
CAS
CSCD
2006年第4期333-336,共4页
Journal of Chinese Electron Microscopy Society
基金
辽宁省教育厅高校研究项目基金资助(No.05L028)