数字电路测试中的关键技术研究

Research on the Key Technologies in the Testing of Digital Circuit

随着数字电路的广泛应用,电路的测试与故障诊断已成为其设计与生产过程的重要组成部分。讨论了电路的测试及故障诊断中的一些问题,主要包括故障模型、故障仿真、故障压缩及可测试性度量与测试矢量生成算法(ATPG),并研究了电路测试技术的发展趋势。

With the extensively application of digital circuit, testing and diagnosis become an important part of their designation and manufacture. Some technologies about the testing and diagnosis of digital circuit are discussed, including fault model, fault simulation, fault compression, and the scale of testability and ATPG.