摘要
采用HiroshiSuzuki等人提出的多步回归分析方法,结合不对称布拉格衍射,对CdZnTe单晶片的残余应力进行了测量。与传统的单晶体应力测量方法比较,这种新方法可以准确测定平面应力状态下的单晶体应力而不受d0值不可靠所带来的影响。
The stresses of the CdZnTe single crystal have been measured by means of multiple regression analysis and asymmetrical Bragg diffraction. Compared with the conventional methods, the new way can determine the stress states in the plane stress condition more easily almost without the effect of the reliability of the stress-free plane spacing do.
出处
《科学技术与工程》
2006年第18期2991-2993,共3页
Science Technology and Engineering
关键词
单晶体
应力
X射线
多步回归分析
不对称布拉格衍射
single crystal stress X-ray multiple regression analysis asymmetrical Bragg diffraction
