期刊文献+

Sn-Ag基无铅钎料Nd:YAG激光重熔界面研究 被引量:5

Interfacial Reaction Between Sn-Ag Eutectic Lead-free Solder Ball and Cu Pad during Nd:YAG Laser Reflow
下载PDF
导出
摘要 通过Nd∶YAG激光重熔和热风二次重熔试验,得到了Sn3.5Ag和Sn3.0Ag0.5Cu无铅钎料球在Cu焊盘的钎料凸台。利用扫描电子显微镜分别分析了激光重熔和热风二次重熔后两种无铅钎料与铜焊盘界面反应及组织形貌,并对激光一次重熔无铅钎料凸台进行了剪切试验,观察了凸台的剪切断口。结果表明,在合适的激光功率和加热时间条件下能够获得成形良好的无铅钎料凸台,Sn3.5Ag和Sn3.0Ag0.5Cu两种无铅钎料与Cu焊盘所产生的界面化合物主要为Cu3Sn和Cu6Sn5,凸台界面反应组织形貌以及剪切承载力与激光功率和加热时间密切相关,而且激光重熔形成的界面化合物影响热风二次重熔界面的组织形貌。 An investigation has been carried out to compare the interface of Cu pad and Sn- 3.5Ag solder and Sn -3.0Ag -0. 5Cu solder during laser reflow and hot air convection reflow. Effects of processing parameters of laser reflow bumping on the evaluation of interfacial intermetallic compounds (IMC) and the shear strength were studied. The parameters including laser reflow time and power on the morphology of intermetallic compounds at solder/pad interface were studied by Scanning Electron Microscopy (SEM) and Energy Dispersive X -ray Spectrometer (EDX). The results revealed that the morphology of the IMC was strongly influenced by laser input energy. The microstructure of IMC changed from a continuous layer into acicular phases and then become broken parts, with the increase of laser input energy. However, the laser input parameters had little effect on the shear strength ,which were definitely influenced by shear failure modes.
出处 《电子工艺技术》 2006年第5期249-255,共7页 Electronics Process Technology
基金 哈尔滨工业大学基金项目(项目编号:HIT.2003.50)
关键词 激光重熔 BGA 无铅 金属间化合物 Intermetallic compounds Lead - free Laser reflow bumping Hot air reflow bumping
  • 相关文献

参考文献16

  • 1Tummala R R. Fundamentals of microsystems packaging [ M]. New york: Mcgraw - hill,2001.2 -44.
  • 2Lau J H, Erasmus S. Review of packaging methods to complement IC performance [ J ]. Electronic packaging & production, 1993,6 ( 36 ) :51 - 56.
  • 3Lau J H,Pao Y H. Solder joint rehability of BGA,CSP, Flip Chip, and fine pitch SMT assemblies [ M ]. New york: Mcgraw - hill, 1997.3 -41.
  • 4Strandjord A J G,Popelar S,Jauernig C. Interconnecting to aluminum and copper - based semiconductors [ J ]. Microelectronics reliability,2002, 42 ( 2 ) :265 - 283.
  • 5Yuto S, Kozo H, Hirofumi F. Study of package waro behavior for high - performance flip - chip BGA [ J ]. Microelectronics reliability, 2003,43 ( 30 ) :465 - 471.
  • 6Darveaux R, Banerji K, Mawer A et al. Reliability of plastic ball grid array assembly, in Ball Grid Array Technol [ M ]. New york: Mcgraw hill, 1995. 400 -410.
  • 7Lau H L. Ball grid array technology [ M ]. New york: Mcgraw hill, 1995. 153 - 170.
  • 8Zhang X, Wong E H, Lee C. Thermo - mechanical finite dement analysis in a multichip build up substrate based package design[ J ]. Microelectronics reliability ,2004, 44 (4) :611 -619.
  • 9Tian Y,Wang C, Ge X et al. Intermetallic compounds formation at interface between PBGA sorlder ball and Au/Ni/Cu/ BT PCB substrate after laser reflow processes [ J ]. Materials science and engineering B,2002, 95 ( 3 ) :254 - 262.
  • 10Tian Y H, Wang C Q, Liu D M. Thermomechanical bechavior os PBGA package during laser and hot air reflow soldering[ J ]. Modeling and simulation in materials science and engineering,2004, 12 (2 ) :235 - 243.

共引文献29

同被引文献94

引证文献5

二级引证文献16

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部