摘要
本文从晶体旋转法测定液晶分子预倾角的ｏ光和ｅ光的位相差表达式出发，详细分析晶体旋转法液晶预倾角测试仪对液晶层厚的适用范围，并指出对于厚度为５～９μｍ液晶层预倾角的测量应采用波长约为４００ｎｍ的光源。
By using the formula expression of the phase retardation of the ordinary and extraordinary light,the suitable range of the method of crystal rotation LC pretilt angle measure for the thickness of LC layer was analyzed in detail. There is a suggestion that for LC layer thickness just within 5～9 μm, we'd better to use a shorter wave length light(for instance 400nm)to measure LC pretilt angle.
出处
《液晶与显示》
CAS
CSCD
1996年第4期260-267,共8页
Chinese Journal of Liquid Crystals and Displays
关键词
晶体旋转法
液晶
预倾角
位相差
液晶显示器件
the method of crystal rotatian,liquid crystal,pretilt angle,the phase retardation
