摘要
通过研究接触器内部触头热故障,建立了接触器的红外热成像检测的热传导模型。利用有限元分析软件ANSYS,对接触器内部触头由于氧化等原因造成接触不良而引起的异常发热进行数值计算分析,得到了触头最高温度随接线端子A-B最小温差的变化曲线。利用接触器表面温度场的变化,可推算接触器内部热故障的严重程度,为接触器内部热故障的红外热像诊断提供了理论依据。
Inner thermal faults of contactor are studied, the modoel of infrared thermal detection ior eontactor is established. The abnormal heating caused by the imperfect inner contact owing to oxidation is calculated with numerical analysis by finite element analysis, curves of highest temperature of contact changing with the lowest temperature difference of connection therminal A-B are got. The degree of the imperfect contact with the inner thermal faults is judged through observing the change of the temperature profile on the contactor surface. The reliable theoretical basis for the infrared thermal diagnosis of inner contact thermal faults is provided.
出处
《电子器件》
EI
CAS
2006年第3期770-773,共4页
Chinese Journal of Electron Devices
关键词
红外检测
接触器
热故障
有限元
infrared detection
contactor
thermal fault
finite element