摘要
对不分离样品主体钼条件下,直接用钼蓝光度法测定硅进行了深入研究;在标准系列中加入钼基体,补偿了钼的影响,加入乙醇消除了溶样产生的钼蓝的干扰,所拟的测定高纯二硫化钼中微量硅的方法,准确度、精密度均好;硅含量为0.034%,RSD为8.8%。此方法已应用到钼化学品生产的实际分析,效果良好。
A new spectrophotometric method for the determination of trace silicon in pure molybdenum disulfide has been studied without separation of molybdenum, the silicon standards were equalled with sample by adding certain amounts of molybdenum ;the molybdenum blue in dissolving process was cancelled by alcohol, The relative standard deviation was 8.8% （ n = 11 ） for determination of 0. 034% silicon. With the good precision and accuracy, the method has been applied to determine trace silicon in pure molybdenum disulfide, the results were satisfactory as ICP- AES.
出处
《中国钼业》
2006年第4期48-50,共3页
China Molybdenum Industry
关键词
硅
硅钼酸
硅钼蓝光度法
二硫化钼
silicon
molybdosilicate acid
reduced molybdosilicate spectrophotometic
pure molybdenum disulfide
