SCANGIN:一种降低扫描测试中动态功耗的方法

SCANGIN:An Approach for Reducing Dynamic Power Dissipation in Scan Test

通过调整扫描链上扫描单元顺序与逻辑门插入相结合,以减少扫描移入阶段扫描链上不必要的状态跳变,从而达到降低测试中电路动态功耗的目的.在ISCAS’89基准电路上进行的实验表明,该方法最多能将扫描移入阶段峰值功耗降低94.5%,平均功耗降低93.8%,而面积开销可以忽略不计.

This paper proposes an approach to eliminate unnecessary transitions on scan chains during scan-in phase. By using scan cells reordering in combination with logic gate insertion, it reduces scan-in power dissipation. Experimental results on ISCAS＇89 benchmark circuits show that the proposed approach can reduce peak power dissipation by 94.5 % during scan test and average power by 93.8 %, with ignorable area overhead.