摘要
介绍了表征光学系统抑制水平的定量指标——点源透过率PST.提出了红外光学系统杂光指标PST的一种测试方法,并在10.6μm波长处,测试了口径为180mm的全反射Ritchey-Chretien红外系统在不同入射角时的点源透过率PST(θ).
A quantitative specification of stray light suppression Point Source Transmittance ( PST ) for infrared optical systems was introduced. A testing method for PST was presented. Using the method described in this paper, PST(θ) of an all reflective Ritchey Chretien infrared system with the entrance pupil diameter of 180mm for various incident angels of off axis stray light source was obtained at the wavelength λ =10.6μm.
出处
《红外与毫米波学报》
SCIE
EI
CAS
CSCD
北大核心
1996年第5期375-378,共4页
Journal of Infrared and Millimeter Waves
基金
国家高技术研究计划资助
关键词
红外光学系统
杂散光
点源透过率
infrared optical system,stray light,Point Source Transmittance ( PST ).