摘要
在运用相位测量剖面术(PMP)对物体进行三维面形测量时,由于测量现场环境光强变化而引入较大误差,严重影响测量精度。本文分析并数字模拟了由环境光变化引入的误差,提出一种现场检测环境光强变化并根据检测结果对获取的条纹图进行校正的方法。计算机模拟和实测表明:运用此方法后减小了测量误差,提高了测量精度。
The accuracy of 3-D surface-shape measurement by phase-measuring profilometry （PMP） is greatly influenced, because the variation of environmental light leads to biggish error. The error caused by the variation of environmental light is analyzed and digitally simulated in this paper, and a rectification algorithm to calibrate the grey scale of fringe pattern is introduced. By using the method, the error is greatly reduced, and the accuracy of the measurement is enhanced.
出处
《光电工程》
EI
CAS
CSCD
北大核心
2006年第9期80-84,共5页
Opto-Electronic Engineering
关键词
相位测量剖面术
环境光
校正算法
计算机模拟
Phase-measuring profilometry
Environmental light
Rectification algorithm
Computer simulation
