荷电离子轰击靶材料损伤潜径迹的原子水平观测研究

Atomic scale observation o flatent tracks induced by ions

叙述了用扫描隧道显微镜（ＳＴＭ）和原子力显微镜（ＡＦＭ）观测研究荷电离子轰击靶材料损伤潜径达的状况和进展．观测研究了Ａｕ离子和Ｈ＋轰击高定向石墨（ＨＯＰＧ）的ＳＴＭ．给出了损伤形貌、损伤范围、表面损伤数密度和离子注入剂量的关系，并对损伤过程进行了分析和讨论．

The topography and size of the damaged area on the surface of HOPG bombarded by An ions and H+are studied.The correlation between the number density and ion lose is also given.The possible process of damage is discussed.