摘要
目的探讨应激状态下2型糖尿病患者胰岛素抵抗(IR)加重的机制。方法根据患者有无合并应激状态分为应激组和对照组。采用葡萄糖氧化酶法、化学发光免疫测定法测定两组患者血浆空腹血糖(FPG)、空腹胰岛素(FINS)水平以及血清皮质醇、生长素(GH)、促卵泡激素(FSH)、黄体生成素(LH)、睾酮(T)、雌二醇(E2)水平的变化。采用Hom amodel:Hom a-IR=(FPG×FINS)/22.5计算胰岛素抵抗指数。结果与对照组相比,应激组的FPG、FINS、皮质醇、GH显著升高(P<0.05),T、E2、FSH、LH显著降低(P<0.05)。Hom a-IR与皮质醇、GH呈正相关(P<0.05),与T、E2呈负相关(P<0.05)。结论应激加重IR的机制可能与神经内分泌相关激素的紊乱有关。
Objective To explore the mechanisms of worsened insulin resistance during severe stress in type 2 diabetic patients. Methods Patients were divided into stress group and control group according to stress or stressless state. Plasma levels of fasting glucose, fasting insulin as well as the serum levels of cortisol, GH, FSH, LH, T and E2 were measured by means of glucose oxidase assay, chemoillumioimmunologic assay, respectively. Insulin resistance index was measured by Homa model index. Results The plasma levels of fasting glucose, fasting insulin and Homa-IR in stress group were higher than those of control group （all P 〈 0.05 ）. The serum levels of cortisol and GH increased signficantly, otherwise, the serum levels of FSH, LH, T and E2decreased significantly in the stress group compared with the control group （all P 〈 0.05）. The Homa-IR index has positive correlation with cortisol and GH and negative correlation with T and E2. Conclusion The mechanisms of worsened insulin resistance probably related to the disorder of neuroendocrine hormone during severe stress in diabetes.
出处
《现代医学》
2006年第5期321-324,共4页
Modern Medical Journal
