基于内建自测试的伪随机测试向量生成方法

The Pseudorandom Test Pattern Generation for BIST

内建自测试作为一种新的可测性设计方法,能显著提高电路的可测性.本文研究了内建自测试中的测试向量的生成方法,详细介绍了由线性反馈移位寄存器构成的伪随机序列生成电路的原理,给出了由触发器和异或门构成的外接型、内接型以及混合型伪随机序列生成电路.

As a new method of design for testability build-in self-test can prominently improve the testability of the circuits. The test pattem generation method is investigated in BIST. The design of pseudorandom sequences generation based on linear feedback shift register is described particularly. The intemal, extemal and combined pseudorandom sequences generations composed of trigger and XOR gate are given.