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B_4C/Mo/Si high reflectivity multilayer mirror at 30.4 nm

B_4C/Mo/Si high reflectivity multilayer mirror at 30.4 nm
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摘要 The B4C/Mo/Si high reflectivity multilayer mirror was designed for He-II radiation (30.4 nm) using the layer-by-layer method. The theoretical peak reflectivity was up to 38.2% at the incident angle of 5°. The B4C/Mo/Si multilayer was fabricated by direct current magnetron sputtering and measured at the National Synchrotron Radiation Laboratory (NSRL) of China. The experimental reflectivity of the B4C/Mo/Si multilayer at 30.4 nm was about 32.5%. The promising performances of the B4C/Mo/Si multilayer mirror could be used for the construction of solar physics instrumentation. The B4C/Mo/Si high reflectivity multilayer mirror was designed for He-II radiation (30.4 nm) using the layer-by-layer method. The theoretical peak reflectivity was up to 38.2% at the incident angle of 5°. The B4C/Mo/Si multilayer was fabricated by direct current magnetron sputtering and measured at the National Synchrotron Radiation Laboratory (NSRL) of China. The experimental reflectivity of the B4C/Mo/Si multilayer at 30.4 nm was about 32.5%. The promising performances of the B4C/Mo/Si multilayer mirror could be used for the construction of solar physics instrumentation.
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2006年第10期611-613,共3页 中国光学快报(英文版)
基金 This work was supported by the National Natural Science Foundation of China (No. 60378021 and 10435050)the Program for New Century Excellent Talents in University (No. NCET-04-0376)the Science Fund of Tongji University.
关键词 Magnetron sputtering MULTILAYERS REFLECTION Synchrotron radiation Magnetron sputtering Multilayers Reflection Synchrotron radiation
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