摘要
对微波光电导法测量半导体少数载流子寿命的测试系统进行灵敏度分析。利用Maxwell方程组的求解和转移矩阵的利用,可对微波光电导测试系统求出反射系数和灵敏度。讨论了灵敏度与样品的电导率、厚度的关系。通过比较一般的测试系统以及它的两种特殊情况发现：对于所有电导率的样品,在测试样品背后的合适位置放置金属反射器可增加测试系统的灵敏度。
The sensitivity for the semiconductor minority cartier lifetime measurement system was determined using microwave photoconductance decay. The reflection coefficient and the sensitivity were determined using Maxwell equations and the method of a transfer matrix. The dependences of sensitivity on the dark conductivity of sample and the thickness of sample for the general and two special measurement configurations were discussed. The result showed that, putting a metal reflector behind the detected sample with an optimal distance L is helpful to increase the sensitivity compared to the other two cases for all conductvity samples.
出处
《太阳能学报》
EI
CAS
CSCD
北大核心
2006年第1期23-29,共7页
Acta Energiae Solaris Sinica
关键词
灵敏度
微波光电导
反射系数
sensitivity
microwave photoconductance
reflection coefficients
