摘要
基于离散无记忆信源模型,分析了变长码的抗误码扩散概率。利用在理想条件下的概率分布,计算了同步变长码的抗误码扩散概率。分析发现同步变长码的抗误码扩散概率与其码距分布有关。给出了一种计算同步变长码码距分布的迭代算法。数值计算结果显示同步变长码的抗误码扩散概率随其移位对称数的增加而减少。
In this paper, based on the discrete memoryless source model, the error resiliency of variable length codes (VLC) is analyzed. By using the probability distribution in perfect condition, the error resiliency of synchronized variable length codes ( SVLC) is counted. It is found that the error resiliency of SVLC is related with its code distance distribution. An iterated algorithm to count the code distance distribution is derived. The numerical calculation results demonstrate that the error resiliency of SVLC decreases with increasing shift symmetry.
出处
《计算机与数字工程》
2006年第10期72-75,共4页
Computer & Digital Engineering
关键词
同步变长码
抗误码扩散
码距分布
移位对称数
synchronized variable length codes, error resiliency, code distance distribution, shift symmetry