对SrTiO_3环形压敏电阻器复阻抗图中奇异现象的分析

An Analysis of the Strange Phenomenon in the Figure of R-X of the Ring SrTiO_3 Varistor

实验发现SrTiO3环形压敏电阻器试样的复阻抗图在高频段有一段圆弧而同样工艺的厚圆片形试样却没有此现象.实验分析得出:该奇异现象的出现并不能简单地归为试样的形状,也不能归为一种新的弛豫机制.分析试样的电阻、电抗频率特性发现出现该现象的主要原因是该试样的表面层结构特征导致其电学性能参数随频率的变化与试样的厚薄有一定的关系.因此,该现象又从另一侧面证实了SrTiO3压敏电阻器试样具有表面层型结构.

It was found by test that the Figure of R-X about the ring SrTiO3 varistor sample had an arc in high frequency but that of the thick and round sample＇s did not. Experiments showed that the strange phenomenon did not result from the shape of the sample or a new relaxation phenomenon. With careful analysis into the frequency characteristic of the resistance and the reactance, the author found that the surface layer structure of the ring SrTiO3 varistor was responsible, and that the electrical properties varying with the frequency was connected with the thickness of the sample. So, conversely, the phenomenon rested SrTiO3 varistor has the characteristic of the surface layer structure by otherwise.