钨钴合金粉中21种杂质元素的直流电弧发射光谱分析

Direct current arc emission spectrographic analysis of twenty-one impurity elements in powder of tungsten-cobalt alloy

介绍用氟化钠作载体,采用载体分馏法,以直流电弧阳极激发在WSP-1平面光栅摄谱仪上一次摄谱,同时测定钨钴合金粉中Fe,Si,Ti,V,Cr,Ca,Mn,Mg,Al,Ni,Cu,Bi,Sn,Pb,Yb,Y,Cd,Nb,Mo,Sb,La21种杂质元素的发射光谱分析方法。测定下限为0.05～36μg/g,回收率为90.5%～125.3%,相对标准偏差为6.7%～20.1%。

Using NaF as carrier, a carrier distillation method of emission spectrographic and DC excitation for the determination of 21 impurity elements, i. e. Fe, Si, Ti, V, Cr, Ca, Mn, Mg, Al, Ni, Cu, Bi, Sn, Pb, Yb, Y, Cd,Nb,Mo, Sb, La in powder of tungsten-cobalt alloy by WSP-1 model plane-grating spectrograph was described. The detection limits of various elements determined are found to be from 0.05 μg/g to 36 μg/g. The recoveries are in the range of 90.5 % - 125.3 % and relative standard deviations are between 6.7 % and 20.1%.