最小相关度的多捕获(Multi-capture)扫描测试结构

A Multi-capture testing based on minimum relativity scan chain

为了压缩测试向量并降低芯片测试成本,本文提出了一种新的基于最小相关度扫描链的多捕获(Multi-capture)测试结构。通过构建具有最小相关度扫描链,使得多捕获测试在保证高故障覆盖率的同时降低所需ATE的存储容量。本文还提出了一种面向最小相关度多捕获结构的测试向量生成算法。采用ISCAS’89基准电路的实验结果表明本文提出的结构和算法可以获得最高近90%的测试压缩比(大电路)。

A Multi-capture scan testing based on Minimum Relativity chain structure is proposed in this paper to compact the larger and larger test patterns. The scan chain organization is optimized to achieve higher fault coverage with little ATE vectors. A new test vector generation method for Multi-capture structure is presented to generate more efficient vectors. Experiments with ISCAS＇89 benchmarks demonstrate its high compact ratio up to 90%.