摘要
利用X射线粉末衍射技术和R ietve ld结构修正方法对A l14G d5S i进行了研究,新三元化合物A l14G d5S i具有N i3Sn结构类型,空间群为P 63/mm c(N o.194)。点阵参数为a=0.63022(1)nm,c=0.45856(1)nm,指标化的可靠性因子F30=218.1(33)。用R ietve ld方法对该化合物的晶体结构成功地进行了精化修正,精修得到的R因子为Rp=0.119,Rwp=0.157。
New ternary compound Al14Gd5Si has been studied by means of X-ray powder diffraction technique and Rieveld method. The ternary compound Al14Gd5Si has a Ni3Sn-type structure, space group P63/mmc （No. 194）, the lattice parameters a=0. 63022 （1）nm, c=0. 45856 （1）nm. The Smith and Snyder figure of merit for index, Fn,is F30= 218.1 （33）. The crystal structure of the compound Al14Gd5Si has been successfully refined by using Rietveld method from X-ray diffraction data. The R-factors of Rietveld refinement are Rp= 0. 119 and Rwp=0.157, respectively.
出处
《稀土》
EI
CAS
CSCD
北大核心
2006年第5期33-35,共3页
Chinese Rare Earths
基金
广西自然科学基金资助项目(0575001)
广西大学博士启动基金资助项目
