摘要
依据被测介质性质,在现有实验设备条件下,提出了一种标量法测量低损耗薄膜介质介电常数的新方法。该方法利用传输线法测量原理,先测量待测介质损耗,间接得到反射系数,由反射系数与介电常数关系式,推导得出待测介质的介电常数。该方法有样品容易制作,测量简单准确等特点。通过测量实例的误差分析,指出标量法测量薄膜材料介电常数的不足,提出相应的改进措施。
A new scalar method of measurement for low loss film medium is presented based on electric properties of measured medium under the present condition of laboratory. By utilizing the principle of transmission measurement, the dielectric loss of medium is firstly measured and reflection coefficient is calculated, then, the medium permittivity is educed by the relationship of reflection coefficient and permittivity. The presented method is of the characteristics of convenient and accurate. Through error analysis of examples, some shortages and improvement plan are discussed in this paper.
出处
《电波科学学报》
EI
CSCD
北大核心
2006年第5期777-781,共5页
Chinese Journal of Radio Science
基金
国家高科技发展计划基金资助项目(AA630308)
关键词
低损耗
薄膜材料
介电常数
测量
标量法
low loss, thin film, permittivity, measurement, scalar method
