应用慢正电子湮灭分析陶瓷表面的辐照损伤

Study on Radiation Damage of Ceramic Surface by Slow-positron Annihilation

正电子湮灭技术(PAT)已被广泛用于探测固体内部的缺陷情况。最近又发展起来一种慢正电子湮灭装置,它可有效地分析固体近表面区域的缺陷分布,成为对一些传统表面检测手段如背散射技术、光电子能谱等的重要补充。本文简要地介绍了这一新方法,并利用它对离子注入陶瓷表面的辐照损伤进行了研究。

The positron annihilation technology has been widely used to measure the inter- nal defects of solid.Recently,a slow-positron annihilation apparatus has appeared and been used to effectively annalyzed the defect distribution of near-surface field of solid materials.It is an impor- tant complement of traditional surface measurement methods such as Rutherford backscattering spectroscopy,X-ray photoelectron spectroscopy,etc.This paper introduces the slow-positron an- nihilation technology,and a radiation damage of ceramic surface implanted with ions has been stud- (?)ed by means of this new apparatus.