含ROM和RAM芯片的数字电路板测试生成

Test Pattern Auto-generating for Digital PCB with RAM and ROM

针对数字电路板中含ROM和RAM芯片电路板故障诊断难的现状,采用器件等效模型方法和改进的组合时序电路测试生成算法,研制开发了一套支持ROM/RAM器件测试生成、集电路模型输入、测试生成算法、故障仿真及IEEE-1445标准测试数据转换功能于一体的数字电路板故障诊断测试数据自动生成系统,应用结果表明,该系统测试生成效率高、故障诊断精度高,具有一定的实用性和推广价值。

With the difficulty of digital circuit diagnosing including ROM/RAM chip, a new method using equal model of chip and irn proved test algorithm is introduced, which integrates the functions of circuit model inputting, test generating algorithm, fault simulating and standard format test dataoutputting. After being practiced, it shows that the system developed has merils of high efficiency in test gen erating and high accuracy in diagnosing. The technology and methods adopted in the system are practical and worthy of using abroad.