用全息摄影术测量XLPE高压电缆绝缘中杂质颗粒的研究

Size Determination of Contaminants in HV XLPE Cable Insulation with Holographic Technique

应用Fraunhofer全息技术发展了一种测量交联聚乙烯(XLPE)电缆绝缘中杂质颗粒的方法。通过对被硅油加热透明的电缆绝缘内杂质颗粒的全息记录、全息图再现,可测得4.0cm长,任意大直径的一段交联电缆绝缘内的杂质颗粒。新方法比起传统的显微镜下切片测量法大大地增加了测量体积,使抽样检查的样本数增加,提高了测得结果的统计学可信度。该方法获得全场内50μm的分辨力和优于8％的精度。本文对新方法的原理进行了描述,实验结果进行了介绍,并进行了验证性对比实验。

Fraunhofer far-field in line holographic technique has been used to develop a new method which allows the size of particles of contaminants in HV XLPE cable insulating layer to be determined without cutting it into thin slices. The thickness of the samples of the cable can be as thick as 4.0 cm when the resolution of 50μm is acquired. Accuracy of the new method is within 8% for the particles bigger than 50μm in diameter.