摘要
详尽分析了VDM—I型高精度细丝直径测量系统中影响测量不确定度的各种因素,将其分为A类和B类评定的不确定度分别讨论,最终将其合成,得到该系统的标准不确定度。
The influence factor of uncertainty in VDM-I high accuracy thinwire measurement is studied. Type A and type B uncertainty of measruement beseparately discussed and finally combined into standard uncertainty of the measurement system.
出处
《宇航计测技术》
CSCD
北大核心
1996年第4期45-48,共4页
Journal of Astronautic Metrology and Measurement