摘要
在非函数图形数据处理的算法中,目前还没有一个算法可以较好解决求解离散数据点所形成的曲线的积分问题。在扩充最小二乘性质的基础上提出了相关算法,并进行可行性和误差分析。该算法已较好运用于纳米材料的DOS图形分析。
There is no software which can perfectly solves the problem of integrating function formed by too much discrete data at present in the algorithms analyzing non-functional graphic data. By the properties of the linear least square the algorithm is given. Feasibility research and error analysis are also shown. The algorithm is well performed in analysis of the nanometer material's DOS
出处
《成都信息工程学院学报》
2006年第5期659-665,共7页
Journal of Chengdu University of Information Technology