纳米晶Cu薄带的单辊法制备及结构分析

Nano-crystalline Cu ribbons prepared by single-roll method and its structural analysis

采用单辊法制备出纳米晶Cu薄带，利用X射线衍射对纳米晶Cu薄带的结构进行分析，并研究了工艺参数对结构的影响。实验发现：纳米晶Cu薄带的平均晶粒度为65．17-121．8nm，辊轮转速越快，喷铸压力越小，保护气压越大，保护气体越冷，薄带的晶粒尺寸越小；纳米晶内部均存在晶格畸变和晶胞参数的涨落，说明采用单辊法制备纯金属薄带会在材料内部产生不同程度的晶格扭曲，Cu带处于非稳定状态；所有样品均发生（200）晶面择优取向，原因可能与单辊法的快淬工艺有关。

Nano-crystalline Cu ribbons were prepared by single-roll method under various technical parameters, and their structures were characterized by XRD. Experimental results show that the crystalline grain of nano-crystalline Cu ribbons is 65.17 121.8 nm. The quicker the speed of copper wheel is, the less the injected gas pressure is, the bigger the protective air pressure is, the colder the protect air is, and the smaller the crystalline grain is. There are distortion and fluctuation of crystalline lattice. All samples possess high preferred orientation crystallographic plane and （200） plane is the most prominent, （311） plane is the second, and other crystallographic planes are not highly preferred. The reason might be related to quick-quenching of single-roller method.