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Effects of oxygen partial pressure on optical properties of NiO_x films deposited by reactive DC-magnetron sputtering 被引量:2

Effects of oxygen partial pressure on optical properties of NiO_x films deposited by reactive DC-magnetron sputtering
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摘要 The influence of oxygen partial pressure on the optical properties of NiOx thin films deposited by reactive DC-magnetron sputtering from a nickel metal target in a mixture gas of oxygen and argon was presented. With the oxygen ratio increasing, the reflectivity of the as-deposited films decreased, and optical band gap increased. Thermogravimetric analysis (TGA) showed that the decompose temperature of the films was above 250℃. After annealed at 400℃, only films deposited at 5% O2/Ar ratio showed high optical contrast which was about 52%. Scanning electron microscope (SEM) results revealed that the changes of surface morphology were responsible for the optical property variations of the films after annealing. Its thermal stability and high optical contrast before and after annealing made it a good potential write-once optical recording medium. OCIS codes: 310.6860, 310.3840, 210.4810, 300.6470. The influence of oxygen partial pressure on the optical properties of NiOx thin films deposited by reactive DC-magnetron sputtering from a nickel metal target in a mixture gas of oxygen and argon was presented. With the oxygen ratio increasing, the reflectivity of the as-deposited films decreased, and optical band gap increased. Thermogravimetric analysis (TGA) showed that the decompose temperature of the films was above 250℃. After annealed at 400℃, only films deposited at 5% O2/Ar ratio showed high optical contrast which was about 52%. Scanning electron microscope (SEM) results revealed that the changes of surface morphology were responsible for the optical property variations of the films after annealing. Its thermal stability and high optical contrast before and after annealing made it a good potential write-once optical recording medium. OCIS codes: 310.6860, 310.3840, 210.4810, 300.6470.
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2006年第11期678-681,共4页 中国光学快报(英文版)
基金 This work is supported by the National High Technology Development Program of China under Grant No.2004AA31G230.
关键词 ANNEALING Magnetron sputtering Morphology Optical properties Optical recording Partial pressure REFLECTION Scanning electron microscopy Thermodynamic stability Thermogravimetric analysis Thin films Annealing Magnetron sputtering Morphology Optical properties Optical recording Partial pressure Reflection Scanning electron microscopy Thermodynamic stability Thermogravimetric analysis Thin films
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