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用有限元方法分析Si/GaAs的键合热应力(英文)

Analysis of Si/GaAs Bonding Stresses with the Finite Element Method
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摘要 在考虑材料热膨胀系数随温度变化后,采用有限元方法结合ANSYS软件对Si/GaAs键合热应力进行了分析,研究了普通应力、轴向应力和剪切力的分布云图和沿界面的分布.同时提出了新的键合结构以减小热应力的影响,计算结果证明了该结构的有效性. In conjunction with ANSYS,we use the finite element method to analyze the bonding stresses of Si/ GaAs. We also apply a numerical model to investigate a contour map and the distribution of normal stress,shearing stress, and peeling stress, taking into full consideration the thermal expansion coefficient as a function of temperature. Novel bonding structures are proposed for reducing the effect of thermal stress as compared with conventional structures. Calculations show the validity of this new structure.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2006年第11期1906-1910,共5页 半导体学报(英文版)
基金 国家重点基础研究发展规划资助项目(批准号:2003CB314902)~~
关键词 键合 热应力 有限元分析 bonding thermal stress finite element analysis
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参考文献7

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二级参考文献4

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