精确测定低对称晶系多晶材料点阵常数的X射线衍射方法

X-ray Diffraction Methods for Accurate Measuring the Lattice Constants of Polycrystalline Materials with Low-symmetry System

点阵常数是多晶材料的重要物理参数之一．陶瓷材料多数属非立方晶系化合物．研究低对称晶系点阵常数的测定方法和提高精度的途径对材料研究有重要的意义．本文提出了联立方程法、联立方程外推法、最小二乘法、最小二乘外推法、线对法、线对最小二乘法等六种测定方法和稳定性判别法、抛弃平均法、最小二乘判别法等三种数据处理方法及其适用条件．用本文的测定低对称晶系多晶材料点阵常数的方法可以得到较精确可靠的结果．

Lattice constant is one of the important physical parameters of polycrystalline materials. Most of the ceramic materials belong to the non-cubic crystal system. Therefore, the study of the precise measurement methods of lattice constant of low-symmetry substance is very important for material research.Six measurement methods: simultancons equation method, simultaneous equation-extrapolation method,least square equation method, least equation-extrapolation method, pair-line method, pair-line least square equation method and three data processing methods: stability diserimination method, selective average method, least square diserimination method are presented in this paper for obtaining the accurate and reliable lattice constants of polycrystalling materials with low-symmetry crystal system.