摘要
基于数学中图模式匹配的概念,根据电路特征在子图同构算法中加入图约束条件,研究了针对不同结构的FPGA逻辑单元都能适用的映射算法FDUMap·实验中应用FDUMap将测试电路映射到不同的逻辑单元中·该算法比现有的专用的逻辑单元映射算法通用性更好,而平均性能上仅相差3%·
Based on the concept of graph pattern-matching, a universal FPGA logic cell mapping algorithm (FDUMap) was studied by adding graph constraints to subgraph i^morphism algorithm according to circuit character. In the experiment, FDUMap can successfully map the benchmarks to logic cells of different structures. Compared with existing logic cell specific mapping algorithms, FDUMap is better in universality and only 3% worse in average performance.
出处
《计算机辅助设计与图形学学报》
EI
CSCD
北大核心
2006年第12期1850-1854,共5页
Journal of Computer-Aided Design & Computer Graphics
基金
国家"八六三"高技术研究发展计划(2005AA1Z1230)
国家自然科学基金(60076014)
上海应用材料科技合作共同计划(AM0406)
关键词
逻辑单元映射
工艺映射
图模式匹配
现场可编程门阵列
logic cell mapping
technology mapping
graph pattern-matching
field programmable gate array