摘要
介绍了一个基于VxWorks和PowerPC的VME插件测试系统TTL的设计及其功能。该测试系统允许硬件开发人员在不同的层次上对VME插件进行常见功能的调试和检测,包括VME总线读写操作、CBLT(Chained Block Transfer),MCST(Multicast)以及IACK(中断响应)测试。在BES III的电子学系统VME机箱和插件级设备的调试和检测中采用了该测试系统,提高了硬件研制及调试的效率。
This paper introduces the design and functions of a testing system for VME modules based on VxWorks and PowerPC. This testing system enables hardware developers to debug and test their common VME module operations, including read/write on VMEbus, CBLT (Chained Block Transfer), MCST (Multicast) and IACK (Interrupt Acknowledge). This testing system is adopted to debug and test the VME modules in the electronic system of BES Ⅲ(Beijing Spectrometer Ⅲ), improving the efficiency of electronic hardware development and debugging.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2006年第6期788-792,共5页
Nuclear Electronics & Detection Technology