摘要
日蒸发率是评价高真空多层绝热杜瓦保冷性能最重要的技术参数。该文对日蒸发率的影响因素进行了总结,重点介绍了储存压力和环境温度对日蒸发率的影响。以充满率为90%的210L小型杜瓦为例,测试了日蒸发率的变化规律。结果表明,杜瓦的日蒸发率与储存压力成正比,同时日蒸发率的波动随着储存压力的升高而增大,且环境温度对日蒸发率的影响出现延迟。
Daily evaporation rate is an important technology parameter to evaluate the heat-insulating property of cryogenic dewar. In this paper, several factors affecting the daily evaporation rate are introduced, especially the storage pressure and environmental temperature. Daily evaporation rates of a 210L small - size high - vacuum multi - layer insulated dewar with 90% liquid nitrogen were measured. From the results, it is found that the daily evaporation rate is in direct proportion to the storage pressure, and the fluctuation of the rate is greater with higher storage pressure. Some time delays are presented in the effect of environmental temperature on the rate.
出处
《低温与超导》
CAS
CSCD
北大核心
2006年第6期404-407,共4页
Cryogenics and Superconductivity
关键词
杜瓦
日蒸发率
储存压力
环境温度
Dewar, Daily evaporation rate, Storage pressure, Environmental temperature