摘要
对在多级电源系统可靠性设计中遇到的几个关于闩锁的问题进行了研究,针对闩锁产生的原因进行分析,并提出解决方法。
Several problems about latch-up power supply systems are studied. A solution experience in the reliability design of multiplex to the problems is proposed based on the cause analysis of latch-up.
出处
《电子产品可靠性与环境试验》
2006年第6期34-36,共3页
Electronic Product Reliability and Environmental Testing
关键词
闩锁
待机
多电源
latch-up
standby
multiplex power supply
