摘要
在金属电子逸出功测定实验中,未考虑由钨丝电子发射引起的损耗,存在约-1.86%的系统误差.用新型红外测温仪可以观察到因上述损耗而出现的钨丝温度的变化,为修正该系统误差提供直接的观察依据.
The experiment of measuring metal electron work function usually neglects the loss caused by the electron emission of tungsten filament, so the system error will be -1.86%. We can observe the change of tungsten filament temperature by using the new infrared thermocope, it offers direct observational basis for revising the system error. K
出处
《物理实验》
2006年第12期8-11,共4页
Physics Experimentation
关键词
红外测温仪
逸出功
发射损耗
infrared thermoscope
work function
emission loss
