摘要
介绍了先进的表面分析仪器化学分析电子能谱(XPS)、原子力显微镜(AFM)、含飞行时间分析器的二次离子质谱仪(ToF-SIMS)的工作原理,回顾了近年来它们在植物纤维表面分析中的成功应用,综合利用XPS、AFM及ToF-SIMS方法,可分析和解决制浆造纸过程中的现象和问题。
The working principles of several advanced surface analysis instrtment including X-ray photoelectron spectroscopy（XPS）, atomic fmee microscopy （AFM） and time of flight secondary ion mass spectroscopy （ToF-SIMS） ate introduced, their successful application in fiber surface analysis recent years is reviewed. They can be used and complement each other to analyze and solve the problems which appear in pulping and papermaking process.
出处
《中国造纸学报》
EI
CAS
CSCD
2006年第4期97-101,共5页
Transactions of China Pulp and Paper
关键词
XPS
AFM
ToF—SIMS
原理
纤维表面
X-ray photoelectron spectroscopy
atomic force microscopy
time of flight secondary ion mass spectro.seopy
working principle
fiber surface
