测定珠光体片层间距的原子力显微镜技术

Atomic Force Microscope Technology for Measurement of Thickness of Lamella Pearlite

原子力显微镜技术(AFM)是20世纪80年代兴起的一种新技术,已广泛应用于多种领域,但在钢铁材料方面的应用尚不多见。采用AFM对82B钢坯的显微结构进行了研究,并与传统的SEM方法进行了比较。结果表明,AFM不仅能清晰地给出珠光体团片层间距的三维形貌,还能够观察到片层取向。根据珠光体片层垂直于观察截面的片层间距,可以得到该珠光体团的真实片层间距。AFM纳米尺度的实验结果显示出珠光体中的Fe3C的双层精细结构以及铁素体中细小颗粒。毫无疑问,AFM技术是钢铁冶金工业显微分析技术中的重要补充手段。

Atomic Force Microscope （AFM） is a new technique rising in 1980s, which is widely used in many fields, but seldom used in detection of iron and steel materials. AFM was adopted to investigate lamellar structures of 82B steel billet, and this technology was compared with the traditional SEM technology. The results show that a threedimensional topography （3D topography） of pearlite can not only be observed, but a clear judgment about the orientation of the lamella pearlite can be achieved as well. True pearlite interlamellar spacing of 82B steel billet can be obtained according to the results of vertical lamellar. The AFM test results also show a double layer fine structure of Fe3C in pearlite and its fine grains in ferrite. It is no doubt that AFM is an important auxiliary method of microstructure analysis technique in metallurgical industry.