摘要
目的探讨高功率微波辐射后下丘脑神经元凋亡、线粒体膜电位与Ca^(2+)的变化。方法以10与30 mW/cm^2高功率微波辐射原代培养的下丘脑神经元,于辐射后6 h采用倒置显微镜和流式细胞术检测细胞的凋亡、线粒体膜电位与胞浆钙离子的变化。结果辐射后6 h,10与30 mW/cm^2组凋亡率与假辐射组相比均明显增加;30 mW/cm^2组辐射后坏死率与假辐射组比较亦明显升高,差异有统计学意义(P<0.05)。辐射后6 h,30 mW/cm^2组Ca^(2+)明显升高,膜电位性明显下降,差异均有统计学意义(P<0.01)。结论细胞凋亡是下丘脑神经元死亡的主要方式之一,胞浆内Ca^(2+)超载及线粒体膜电位的下降参与其损伤过程。
Objective To explore the injury effect and mechanism of hypothalamic neurons after high power microwave(HPM) exposure. Methods Primarily cultured hypothalamic neurons were exposed to 10 and 30 mW/cm^2 HPM, and the inverted phase contrast microscope(IPCM) and flow cytometry(FCM) were employed to detect the injury of cells and change of mitochondrion membrane potential(MMP) and Ca^2+ in the cytoplasm of neurons. Results The ratio of apoptosis was significantly higher than that of the sham exposure( P 〈0.05) induced by 10 and 30 mW/cm^2 HPM and necrosis increased significantly( P 〈0.05) in the group of 30 mW/cm^2 at 6 h after exposure. The content of Ca^2+ in the cytoplasm of neuron cells increased( P 〈 0.01 ) while MMP decreasedsignificantly(P〈0.01) after radiation of 30 mW/cm^2 HPM at 6 h after exposure. Condusion Apoptosis is one of the major death ways of hypothalamic neurons. The overloading of Ca^2+ and the decline of MMP axe involved in the process.
出处
《中华劳动卫生职业病杂志》
CAS
CSCD
北大核心
2006年第12期739-741,共3页
Chinese Journal of Industrial Hygiene and Occupational Diseases
关键词
微波
神经元
细胞凋亡
钙
膜电位
Microwave
Neurons
Cell apoptosis
Calcium
Membrane potential