故障诊断的高级模型方法及人工智能的应用

High-Level Model Approaches And AI Application Of Fault Diagnosis

数字电路模型的高级化是 VLSI 技术发展的必然趋势,本文阐述了两类目前较有代表性的高级模型方法即算法式方法和启发式方法,同时对人工智能在数字系统故障诊断领域中的应用和发展作了较全面的分析,并对其在知识表达和应用方面的问题作了初步的研究和探索.

As the development of VLSI technique,the test generation approaches based on the high level models are gradually becoming the main tedency of the fault diagnosis ap- proaches in digital circuits.This paper describe the two kinds of typical high level test gen- eration approaches which are the algorithmic approach and the heuristic approcah.This paper also give the analysis of the AI research and development in the test generation,and take some search about the knowledge presentation,kowledge acquirement and knowledge application in digital system.